IEDM Papers Review - Hallo friendsCAR ON REPIYU, In the article you read this time with the title IEDM Papers Review, We have prepared this article for you to read and retrieve information therein. Hopefully the contents of postings Article car review, Article mobile review, We write this you can understand. Alright, good read.

Title : IEDM Papers Review
link : IEDM Papers Review

IEDM Papers Review

Semiconductor Engineering publishes Mark Lapedus review of IEDM 2017 Imaging Session papers:

- TSMC and EPFL presented "a paper on what they call the world’s first back-illuminated 3D-stacked, single-photon avalanche diode (SPAD) in 45nm CMOS technology.

The SPAD achieves a dark count rate of 55.4cps/μm2, a maximum photon detection probability of 31.8% at 600nm, over 5% in the 420-920nm wavelength range, and timing jitter of 107.7ps at 2.5V excess bias voltage at room temperature."

- Sony presented "a paper on a CMOS photon detector - a non-electron-multiplying CMOS image sensor photon detector. Based on a 90nm process, Sony’s CMOS photon detector features 15μm pitch active sensor pixels with a complete charge transfer and readout noise of 0.5 e- RMS.

The pixel circuit is a conventional 4T pixel. The pixels are arrayed, resulting in a high conversion gain of 132uV/e-, according to the paper. The photodiode is expanded to a size of 14.7μm x 13.1μm in a pixel with a pitch of 15μm, resulting in a physical fill factor of 76% without using back illumination. 4 pixels in a column are simultaneously accessed and read."

Thus Article IEDM Papers Review

That's an article IEDM Papers Review This time, hopefully can give benefits to all of you. well, see you in posting other articles.

You are now reading the article IEDM Papers Review with the link address https://caronrepiyu.blogspot.com/2017/12/iedm-papers-review.html

Tweet

Subscribe to receive free email updates: