Title : ST to Present ist Quantum Dot SWIR Sensor at IEDM 2021
link : ST to Present ist Quantum Dot SWIR Sensor at IEDM 2021
ST to Present ist Quantum Dot SWIR Sensor at IEDM 2021
IEDM Press Kit shows few figures from STMicro presentation of its quantum dot NIR/SWIR imager paper:
Paper #23.4, “1.62µm Global Shutter Quantum Dot Image Sensor Optimized for Near and Shortwave Infrared,” J.S. Steckel et al, STMicroelectronics
Record Quantum Efficiency for NIR/SWIR Sensors: STMicroelectronics researchers will report a 1.62µm pixel-pitch global shutter sensor for imaging in the near-infrared (NIR) and shortwave infrared (SWIR) regions of the light spectrum. It demonstrated record optical performance: an unprecedented quantum efficiency of >50% and a shutter efficiency of >99.94%. The breakthrough was made possible by use of a novel colloidal PbS quantum dot thin-film technology, and the devices were fabricated on a 300mm manufacturing toolset.
- The top photo is of a qualification wafer showing (a) elementary quantum film (QF) test structures; (b) pixel matrix test chips; and (c) full image sensor products.
- Going from left to right in the middle set of images/drawings are a QF photodiode array integrated on top of a CMOS readout IC; the QF photodiode cross-section; and a graphical description of the device stack.
- At the bottom is an outdoor image taken with the 940nm NIR QF sensor (left) and with a high-end smartphone camera (right). The NIR image shows a significant difference in contrast, and the ability to clearly identify the black electrical wires hidden in the tree leaves, vs. the visible image.
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