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Title : ON Semi on 1.1um Pixel Spatial Resolution Measurements
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ON Semi on 1.1um Pixel Spatial Resolution Measurements

ON Semi presents at Conference: Electronic Imaging 2018, Burlingame, CA, "Characterization of Image Sensor Resolution by Single Pixel illumination" by Victor Lenchenkov, Orit Skorka, Robert Gravelle, Ulrich Boettiger, and Radu Ispasoiu. Few slides:

"Illumination single 1.1 um pixel provide information for image sensor PSF and MTF and can be used for image processing and simulation calibration. Measurements PSF across image plane could result in image correction as function of image height."

One can see that microlens layer gives quite a marginal MTF improvement in 1.1um pixel measurements:

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